Sl. No |
Name of the Equipment |
Specification/
Features/ make of the equipment |
Uses of the equipment
|
User form
|
1 |
Transmission electron microscopy (TEM) |
Talos F200S |
Features
- Class-leading optical performance: Constant-power X-TWIN objective lens
- Maximized ease-of-use: Fast, easy operational parameter switching for multi-user environments
- Ultra-stable platform: Constant power objective lens, robust system enclosure, and remote operation ensure maximum stability
- SmartCam camera: Digital search-andview camera offers a large field of view for all applications and allows operation in normal room light
- Fully integrated fast detector: Ceta 16M pixel CMOS camera provides large field of view and high read-out speed (25 fps @ 512 × 512)
- Full remote operation: Automatic aperture system in combination with the Ceta camera supports full remote operation
Total beam current FEG > 150 nA Probe current 0.6 nA @ 1 nm probe (200 kV) EDS system 2 SDD windowless design, shutter-protected Energy resolution
≤136 eV for Mn-Kα and 10 kcps (output) Fast EDS mapping Pixel dwell times down to 10 μs |
TEM Pdf file |
2 |
Scanning Electron Microscope with EDS |
Carl Zeiss
MA15 / EVO 18 Scanning Electron Microscope
Oxford Instruments NanoAnalysis
INCA Energy 250 Microanalysis System (EDS) |
Scanning electron microscope with graphical user interface (GUI), digital image store and image processor, monitor, large specimen chamber, 5-axis motorised stage, SE-detector, and fail-safe vacuum system with oil-free turbo molecular pump.
- Resolution 3.0 nm at 30 kV with SE detector
Resolution 4.5 nm at 30 kV in Low vacuum mode by BSD
- Tungsten hairpin filament
Magnification- 5x to 1,000,000x
Sputter Coater
Inca 250 EDS with 130eV INCAx-act Peltier cooled Analytical SDD
Detector with PentaFET® Precision having capability of Quantitative, Qualitative, mapping, Point & ID etc. including cobolt standard on pin stub |
SEM Pdf file
EDX Pdf file |
3 |
Atomic Force Microscope (AFM) |
Park XE-100 |
Contact AFM, Non-contact AFM, Intermittent / Dynamic/ Tapping Mode, Magnetic Force Microscopy, Low-current Conductive AFM / Low current STM (noise level <3pAmp or better, gain: 103 to 109 V/A or better) and I-V spectroscopy, 5 μm XY scanner, Electrostatic Force microscopy to measure electrical properties. |
AFM Pdf file |
4 |
SPM coupled Nanoindenter |
Hysitron TI950 Triboindenter |
Nanomechanical Characterization of ultra thin films, nanobiomaterials
(only for Epitaxial Films) |
SPM coupled Nanoindenter Pdf file |
5 |
Powder X-Ray Diffractometer |
PANalytical
X’Pert Powder XRD System |
- Standard Phase Analysis and Phase Identification for Powders with the ICDD database.
- Flat Sample Stage for mounting powder samples and thin film samples.
- Fixed Divergent Slits.
- Programmable Receiving Slits.
- Fixed Anti scatter slits.
- Proportional Counter detector
- Phase quantification by Calibration and Standardless RIR method in various types of specimens.
- HiScore Plus Software
- Monochromator for Sealed Xe Proportional Counter detector
- Spinning Sample Stage – Unique Reflection cum Transmission Sample Spinner Stage for powder samples with preferred orientation, thin film characterisation of Single and Multi -Layered Polycrystalline Thin Films, Stress Measurements and SAXS measurements, Analysis of air sensitive samples. With controlled Phi rotation
- SAXS Software
|
Powder-XRD PDF file |
6 |
High Resolution
X-Ray diffraction (HRXRD) |
PANalytical
X-Pert Pro MRD Resolution
0.0001° /0.36 arcsec
Ge- (220) monochromator
Triple axis (Xe) detector
Pixel detector |
Gonio and 2θ scan(peak position ), omega scan(Crystalline quality ), omega-2qscan(composition and thickness), Reflectivity (thickness and roughness) RSM (Lattice mismatch and strain) Chi and Phi scan |
HRXRD Pdf file |
7 |
FTIR Spectrometer |
JASCO INTERNATIONAL CO. / JAPAN
FOURIER TRANSFORM INFRARED SPECTROMETER
MODEL FTIR-6300 |
Wave number Range: 7,800 - 350 cm-1
Resolution:0.07cm-1
Demountable Liquid cell with NaCl windows
SINGLE REFLECTION ATR Model: ATR PRO470-H; ATR Crystal : Diamond
ATR PRO 410 –M MULTIPLE REFLECTION ATR ACCESSORY
CRYSTAL MATERIAL : ZnSe
INFRA RED MICROSCOPE UPGRADABLE TO MULTICHANNEL / ARRAY DETECTOR
IRT-5000-32 INFRARED MICROSCOPE X32 CASSEGRAIN
Standard detector: Single wide-band MCT (7800 – 450 cm-1)
ATR-5000-Z ATR Objective with ZnSe prism |
FTIR Form1 pdf file |
8 |
Photo-luminescence (PL) |
Spectra physics Argon ion-488nm and 514nm tunable laser Wave train for doubling the wavelength of 488nm (244nm UV laser )
Horiba jobin Monochromator 330nm and 550 nm PMT detector |
Emission spectrum, defect analysis, and Band gap of the materials |
PL Pdf file |
9 |
Portable Laser Raman Spectrometer |
Raman Systems
200-1000 Cm-1 |
Raman Analysis of Crystals, Pellets |
Raman Spectrometer
Pdf file |
10 |
Fluorimeter |
JASCO Make
Emission Range : 200-750 nm |
Fluorescence Analysis of Crystals, Pellets |
Fluorimeter Pdf File |
11 |
Integrated measurement system |
IMS-2000 |
IV and CV measurements |
|
12 |
Dynamic Light Scattering |
ZEN3600
He – Ne laser ( 633 nm), size range – 0.3 nm to 10 µm, Conductivity range:0 to 200 mS/cm, Molecular weight range: 342 Da to 2x107Da Temperature range: 0 0 C to 90 0C
VIS5001Minimum sample volume – 1 mL, fluid viscosity - 0.3 to 10,000mPa.s |
Particle size measurement and size distribution of particles in emulsions and molecules dispersed or dissolved in a liquid.
To determine the molecular weight of proteins.
To determine the zeta potential of the colloidal suspension. |
Dynamic Light Scattering Pdf File |
13 |
Metrological Optical Microscope |
Carl Zeiss Aixoscope
Reflected and Transmitted light illumination. Magnification 50x-1000x |
Bright and Dark field and Differential interference contrast (DIC) studies |
Metrological Optical Microscope Pdf file |
14 |
Optical Stereo Microscope |
Stereo discovery V8
Magnification – 460 X
Halogen lamp – 15 V – 150 W
Transmitted light with bright/dark field and variable oblique light |
Used to study the surface morphology of solid, crystals, circuit board, biological specimens. |
Optical Stereo Microscope Pdf file |
15 |
DC Polling Unit |
Field : 50kV/cm Resolution 1% Input 220 V AC50 Hz |
To poll the dipoles for ferro electric characterization |
DC Polling Unit Pdf file |
